Figure 1
50 μm field of view bright field LEEM image of graphene islands (dark areas) atop a ruthenium single crystal substrate (light). Image collected with incident electron energy of 7.1 eV. The I(V) curve is extracted from an area on the graphene island marked by the yellow cross-hair.
Figure 2
Intensity-Voltage data sets can be envisioned as a vertical stack of LEEM or LEED images acquired at varying incident electron energies. Shown here is an example of real space LEEM images acquired at multiple energies. The intensity of a given pixel varies from image to image as a function of electron energy; this relationship is shown to the right with the intensity extracted from the location labeled by the red dots. For clarity not all images from the data set are shown.
Figure 3
LEED pattern obtained from a 5 μm diameter region on the 2H surface termination of MoS2 with an incident electron energy of 85.0 eV [1]. I(V) curves are extracted from three user selected diffracted electron beams. The center beam intensity is extracted using an 80 × 80 pixel window, the first order diffracted beam intensities are extracted using a 40 × 40 pixel window.
Figure 4
For LEED analysis, the local background signal (white) can be automatically generated from a user selection (red). Here the I(V) data is plotted from the user selected electron beam and six background windows equally spaced around the selected beam are generated for background analysis.
Figure 5
A test data set for LEED I(V) data is provided with the source. This data is created to simulate an electron diffraction I(V) data set and test the user data selection process.